Page 367 - Content.pmd

product quality) (Vital factor) GuTÕ A[Ü §ÚjRj§u
A[dÏm NôR]eLû[ GlùTôÝÕ A[Ü (Caliberation) LôX CûPùY° (frequency) Utßm
§ÚjRm (caliberation) ùNnV úYiÓm? A[dÏm Øû\Ls (Measurement process)
Ød¡VUô] (Importance ) Utßm ùSÚdL¥Vô]
A[dÏm NôR]eLs A[Ü §ÚjRm GuTÕ
(Critical ) ¨ûXLû[ ùTôßjÕ AûUÙm.
• RVô¬lTô[oL°u T¬kÕûWlT¥
SpX RWUô] A[Ü §ÚjRm (Caliberation)
• CVk§W Utßm ªuNôW A§oÜLÞdÏ
ÕpXõVm (Precision) Utßm ÖÔdLjûR
©\Ï (accuracy) úTÔ¡\Õ (Maintain) A[dÏm
• ϱl©hP CûP ùY°L°p LÚ®L°u A[Ü §ÚjRm (Caliberation)
(BiÓúRôßm LôXôiÓ UôRkúRôßm) CWiÓ úSôdLeLû[ ùLôi¥ÚdÏm. Juß
A[Ü §ÚjRm Gu\ôp Gu]? A[dÏm LÚ®L°u ÖÔdLjûRÙm Utßm
(accuracy) A[ÜLû[Ùm AûPVô[lTÓjR
LÚ®L°u ©ûZLû[ A±®Vp NôokR
(Tracceability) Eߧ ùNnV úYiÓm (defermines)
Utßm Øû\Vô] A§L ÖÔdLm EûPV
UôvPÚPu Jl©hÓ A±YRôÏm. A[ܧÚjRm (Caliberation) A[Ü Á\p (Out of
caliberation) EûPV A[dÏm LÚ®L°u
A[dÏm LÚ®L°u úSoûUVô] úNôRû] ¬lúTo (Repair) B¡VYtû\Ùm Es[Pd¡VÕ.
ùNnVÜm Utßm A[lTRtÏ ELkRRô Guß
A[Ü §ÚjR (Caliberation) YpÛSoL°u
BWônkÕ ùLôs[Üm TVuTÓ¡\Õ.
A±dûL (Report) «p A[dÏm LÚ®L°u
Ck§V RW (ISS) úUXôiûU êXm
Øu©u §ÚjR A[ÜLû[ ϱdÏm (Before
ùY°«PlThP Ck§V RW ¨oQV
and after caliberation)
ϱl× T¥ (Indian standard specification)
A[Ü §ÚjRm (Caliberation) GlT¥ ùNnYÕ
ϱl©PlThÓs[ AàU§dLlThP ©ûZ
GuTRtÏ ùY° A[Ü ûUdúWô ÁhPo (Out
A[ÜLÞPu (Permissible error) A[Ü §ÚjRm
side micrometer) TVuTÓjÕm Øû\ûV
(Caliberation) ùNnYRôÏm CÕ RÏkR
ERôWQUôL á\Xôm.
RWjÕPu (Standard) JlÀÓ ùNnVlThÓ
AàU§dLlTÓm ©ûZ A[YôÏm. C§p ûUdúWô ÁhP¬u vúLXõu
ÖÔdLúU Ød¡V YûWVûW BÏm (Parameter)
BhúPô ùUôûTp ùRô¯t NôûX RWj§u
úUÛm ûUdúWôÁhPo ê¥V ¨ûX«p
T¥ ISO / TS 16949 EXL RWj§tÏ CûQVôL
(Closed position) ARu é_óV ©ûZûVÙm (Zero
ùUN¬e £vPm A]ôXõv (M.S A) A[Ü
error) A[dÏm TWl©u (Measuring surface)
§ÚjRm (Caliberation) AY£VUôÏm. A[Ü
§ÚjRm NABL India National ) Accreditation board for CûQVô] NUR[jûRÙm (paralle lisim & flatness
& ) ϱlTRôÏm.
caliberation) BnÜ áP (Laboratries) ØLYoL[ôp
(Agencies) RÏkR BYQeLs êXm vúLûX A[Üj §ÚjRm ùNnV
Nôu\°dLlTP úYiÓm(Certify) CkR BnÜ A[Üj§ÚjRm ùNnR vXõlúL_ó (Slip gauge)
áPeLs Ck§V AWNôeLjRôp Be¡LôWm TVuTÓ¡\Õ A[Ü §ÚjRm ùNnVlThP
(Accrediting ) ùTt\ûY BÏm. Bl¥dLp ©[ôh (Calibereated opticalflat)
CûQVô] NUR[jûR úNôRû] ùNnVl
A[Ü §ÚjRm (Caliberation ) úUtLiP RW
TVuTÓ¡\Õ.
Nôu±°l× R®W BnYLj§u (Lab) LôkR
RûXÂÓ (Magnetic interference) RÏkR ùY°fNm
(Lighting), A§oÜLs (Vibration) DWjRuûU
(humidity) ùYlT¨ûX (temperature) B¡VYt±u
Ñtß×\ ãr¨ûX LÚj§p ùLôiÓ (IS 199
RWj§u T¥ ϱl©PlTh¥ÚdÏm ApXÕ
(NABL) BnÜ BYQm úRûYVô] A¥lTûP
(essential criteriation) BnYLj§u A[Ü §ÚjRm
T¥ (QSS quality system standard ) RW AûUl×
U§lÀh¥u T¥ (ISO/IEC/1702352015)
úRokùRÓdL úYiÓm.
A[Ü §ÚjRj§u (Caliberation) Ød¡V LôW¦

346 £_õ & Gm: @©hPo (NSQF - Revised 2022) ------ R.T. for Ex. No.1.6.86-88